An innovative system designed to enhance manufacturing efficiency through predictive maintenance using machine learning.

      Goniophotometers measure the luminance distribution of light emitted or reflected from a point in space or a material sample. Increasingly there is a need for such measurements in real-time, and in real-world situations, for example, for daylight monitoring or harvesting in commercial and residential buildings, design and optimization of greenhouses, and testing laser and display components for AR/VR and autonomous vehicles, to name a few. However, current goniophotometers are ill-suited for real-time measurements; mechanical scanning goniophotometers have a large form factor and slow acquisition times. Parallel goniophotometers take faster measurements but suffer from complexity, expense, and limited angular view ranges (dioptric angular mapping systems) or strict form factor and sample positioning requirements (catadioptric angular mapping systems). Overall, current goniophotometers are therefore limited to in-lab environments.      To overcome these challenges, UC Berkeley researchers have invented an optical sensor  for parallel goniophotometry that is compact, cost-effective, and capable of real-time daylight monitoring. The novel optical design addresses key size and flexibility constraints of current state-of-the-art catadioptric angular mapping systems, while maximizing the view angle measurement at 90°. This camera-like, angular mapping device could be deployed at many points within a building to measure reflected light from fenestrations, in agricultural greenhouses or solar farms for real-time monitoring, and in any industry benefitting from real-time daylight data.

Prof. Sheldon Tan and his team have developed a new hierarchical learning-based electro-migration analysis method called HierPINN-EM to solve for multi-segment interconnects in VLSI chips. HierPINN-EM provides much better accuracy, faster training speeds and faster inference speeds compared to current state-of-the-art techniques. 

 The dynamic patterning of 3D optical point clouds has emerged as a key enabling technology in volumetric processing across a number of applications. In the context of biological microscopy, 3D point cloud patterning is employed for non-invasive all-optical interfacing with cell ensembles. In augmented and virtual reality (AR/VR), near-eye display systems can incorporate virtual 3D point cloud-based objects into real-world scenes, and in the realm of material processing, point cloud patterning can be mobilized for 3D nanofabrication via multiphoton or ultraviolet lithography. Volumetric point cloud patterning with spatial light modulators (SLMs) is therefore widely employed across these and other fields. However, existing hologram computation methods, such as iterative, look-up table-based and deep learning approaches, remain exceedingly slow and/or burdensome. Many require hardware-intensive resources and sacrifices to volume quality.To address this problem, UC Berkeley researchers have developed a new, non-iterative point cloud holography algorithm that employs fast deterministic calculations. Compared against existing iterative approaches, the algorithm’s relative speed advantage increases with SLM format, reaching >100,000´ for formats as low as 512x512, and optimally mobilizes time multiplexing to increase targeting throughput. 

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The inventors have discovered a new way to generate ultrafast back-gating, by leveraging the surface band bending inherent to many semiconductor materials. This new architecture consists of a standard bulk semiconductor material and a layered material on the surface. Optical pulses generate picosecond time-varying electric fields on the surface material. The inventors have successfully applied this method to a quantum well Rashba system, as this is considered today one of the most promising candidates for spin-based devices, such as the Datta Das spin-transistor. The technology can induce an ultrafast gate and drive time-dependent Rashba and quantum well dynamics never observed before, with switching faster than 10GHz. This approach minimizes lithography and will enable light-driven electronic and spintronics devices such as transistors, spin-transistors, and photo-controlled Rashba circuitry. This method can be applied with minimal effort to any two-dimensional material, for both exfoliated and molecular beam epitaxy grown samples. Electric field gating is one of the most fundamental tuning knobs for all modern solid-state technology, and is the foundation for many solid-state devices such as transistors. Current methods for in-situ back-gated devices are difficult to fabricate, introduce unwanted contaminants, and are unsuited for picosecond time-resolved electric field studies.  

Profs. Ruoxue Yan, Ming Liu, and their colleagues from the University of California, Riverside have developed a two-step sequential broadband nanofocusing technique with an external nanofocusing efficiency of ~50% over nearly all the visible range on a fibre-coupled nanowire scanning probe. By integrating this with a basic portable scanning tunneling microscope, the technology captured images with spatial resolution as low as one nanometer at high resolution. The high performance and vast versatility offered by this fibre-based nanofocusing technique allows for the easy incorporation of nano-optical microscopy into various existing measurement platforms.  Fig. 1: High-resolution NSOM mapping. a, scanning tunnelling microscope topographic image of single wall carbon nanotubes on a gold film. Top inset: cross-sectional profile along the dashed line. Bottom inset: the possible configurations of the bundle.  

Researchers led by Dr. Potkonjak from the UCLA Department of Computer Science have developed a technique to detect hardware Trojans in integrated circuits.

UCLA researchers in the Department of Physics have developed a plasma opening switch that enables quick diversion of multi-gigawatt pulses to a protective shunt circuit.

Researchers at UCI have developed a fully integrated sample mount for the simultaneous high-resolution imaging and electronic and optical characterization of thin film devices.

The technology is a development of a more efficient particle accelerator in terms of energy, cost and space considerations. It is used in particle acceleration applications (cancer treatment, manufacture of components for electronic devices, etc.) The technology is an ultra-compact particle accelerator and particle source. The properties include: Laser Wakefield Accelerator in a solid medium, i.e. crystal in which the Laser Wakefield by charged particle beam bunch. The driver is a high intensity pulsed x-ray. The technology applicable to electron, proton, and ion acceleration and can be used for ultra-compact particle source (neutrons, muons, and neutrinos)

The technology is a circuit that recovers a full-rate clock signal from a random digital data signal. Properties include: achieves frequency and phase locking in a single loop and a wide acquisition range.

The application of novel manufacturing techniques, chemical modifications and alternative materials produces the next generation of lenses. These lenses are inexpensive, contain improved numerical aperture and can be easily manufactured. Overall, these improvements create new applications for miniaturized optical and optical electronic devices.