UNIVERSITY of CALIFORNIA, SANTA BARBARA

Brief Description

A novel preamplifying cantilever (PCL) design for scanning probe microscopes (SPM) that is capable of mechanically amplifying specimen movements.

Background

Both AC electric fields and actuation frequency directly influence the output amplitude and signal- to- noise ration of the measurement. However, the number of times the required AC electric fields for the good signal-to-noise ratio is in the same order of magnitude to create polarization in the specimen, thereby affecting the measurement.  

Description

Researchers at the University of California, Santa Barbara have created a novel preamplifying cantilever (PCL) design for scanning probe microscopes (SPM) that is capable of mechanically amplifying specimen movements. Initial tests show an amplitude amplification greater 10 and a high improvement on the signal to noise ratio of the overall measurement. The cantilever design fits seamless into existing scanning probe microscopes and fabrication schemes for cantilevers.

Advantages

• Mechanical preamplification up to 100x
• Increased sensitivity and signal-to-noise ratio

Suggested uses

• Scanning probe microscopes
• Ferroelectric domain imaging        

 

This technology is available for licensing.

PATENT STATUS

• Patent Pending

INVENTORS

• Pittenger, Bede
• Zeyen, Benedikt

Other Information

Contact

Franco Caporale/ caporale@tia.ucsb.edu / tel: 805-893-2073. Please reference Tech ID #19179.