Method for Extending Depth of Field for Microscopy Images

Tech ID: 29313 / UC Case 2018-481-0

Abstract

Researchers at the University of California, Davis have developed a method to extend the depth of field of microscopy images by combining ultraviolet (UV) surface excitation and focal sweep imaging. This method provides high-resolution images processed in near- real-time.

Full Description

The numerical aperture of a microscope objective is a major factor for resolution during imaging. These lenses, however, greatly limit the depth of field of the image and are not suitable when imaging thick or non-sectioned tissue samples. Previous technologies combat this by exciting the sample surface with ultraviolet light or use focal sweeping to collect a series of sample images and aggregate them into a single image. Even these methods, however, require segmentation and computational steps that inhibit rapid image processing. There is a need for methods to produce high-resolution microscopy images with an extended depth of field with a short image processing time.

Researchers at the University of California, Davis have developed a method of extending the depth of field of microscopy images through the combination of ultraviolet (UV) surface excitation and focal sweep scanning. This method is compatible with current microscope designs, with little retro-fitting required to implement the method. Essentially, a single image is produced by synchronizing focal sweeping and camera exposure time, enabling near-real-time image processing. AI-based noise-reduction techniques post processing produce rapid, high quality, low-noise images

Applications

  • Microscopy
  • Tissue imaging
  • Imaging

Features/Benefits

  • Extended depth of field for thick/non-sectioned samples
  • Short computing time
  • High resolution images
  • Compatible with standard microscopes

Patent Status

Patent Pending

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Inventors

  • Fereidouni, Farzad
  • Levenson, Richard M.

Other Information

Keywords

microscopy, UV excitation, extended depth of field, focal sweep scanning, high-resolution microscopy image, short image processing time

Categorized As