UCLA Researchers in the Electrical Engineering Department have developed a novel spectroscopy and microscopy method and apparatus for extremely fast image acquisition. It eliminates the need for a traditional optical spectrometer and requires no moving parts, enabling high-throughput 4D imaging snapshots for fast and efficient sample identification.
Known analysis techniques, such as conventional repetitive-waveform probe spectroscopy, are unable to attain very high scan rates. This limits throughput and prevents molecular spectra measuring at any one moment in time. Thus, existing sample identification and cancer screening techniques are slow and have some margin of error. Furthermore, known optical spectrometers are physically bulky, which prevents their use in some applications.
The novel analysis method and apparatus can measure stimulated Raman scattering (SRS), coherent anti-stokes Raman scattering (CARS), and coherent Stokes Raman scattering (CSRS). It can analyze samples that are rapidly and irreversibly evolving, or destroyed by continuous exposure used in conventional techniques. Its extremely fast image acquisition times enable high throughput and can be used to directly monitor temporal dynamics of ultra-fast reactions, even capturing the Raman spectrum of a single molecule as it evolves.
|United States Of America||Issued Patent||7,821,633||10/26/2010||2006-526|