Asymmetrically Cladded Laser Diode with Improved Performance
Tech ID: 21806 / UC Case 2009-614-0
Brief Description
An asymmetrically cladded laser diode that achieves a low threshold current density and improved lasing behavior due to its structure.
Background
Since symmetrically cladded and clad-free laser diode structures suffer from unwanted material properties and poor performance, such as high series resistance, low hole injection and difficulty of fabrication, there is a need for a new device that avoids these problems.
Description
Researchers at the University of California, Santa Barbara have developed an asymmetrically cladded laser diode combining a lower refractive index material, such as aluminum gallium nitride, for the bottom cladding layer, and a higher refractive index material, such as gallium nitride, for the upper cladding layer. This device achieves a low threshold current density and improved lasing behavior due to its structure. Moreover, production of the device is made simpler because p-type aluminum gallium nitride, which is used in symmetrically cladded devices and is difficult to grow, is not needed.
Advantages
- Low threshold current density and improved lasing behavior
- Helps place the peak of the optical mode at the center of the active region
- Increased ease of cleaving due to asymmetric in-plane strain
- Simpler production since p-type aluminum gallium nitride, which is difficult to grow, is not needed
Applications
- Nitride-Based Laser Diodes
This technology is available for licensing. See below for a selection of the patents and patent applications related to this invention. Please inquire for full patent portfolio status.
Patent Status
| Country | Type | Number | Dated | Case |
| United States Of America | Published Application | 20120076165 | 03/29/2012 | 2009-614 |
Inventors
- Chakraborty, Arpan
- DenBaars, Steven P.
- Lin, You-Da
- Nakamura, Shuji
Other Information
Categorized As
Related cases
2009-614-0
Keywords
SolidState, TIALighting
Contact
Shaun R. Juncal / juncal@tia.ucsb.edu / tel: View Phone Number. Please reference Tech ID #21806.
ADDITIONAL TECHNOLOGIES BY THESE INVENTORS
- Fabrication Of High Quality P-Type GaN and Alloys by Preventing Hydrogen Incorporation
- Reduced Dislocation Density of Non-Polar GaN Grown by Hydride Vapor Phase Epitaxy
- Growth of Planar, Non-Polar, A-Plane GaN by Hydride Vapor Phase Epitaxy
- Nonpolar (Al, B, In, Ga)N Quantum Well Design
- Electrically-Pumped Vertical-Cavity Surface-Emitting Laser (VCSEL)
- Improved Manufacturing of Semiconductor Lasers
- High Efficiency LED With Emitters Within Structured Materials
- Yellow-Emitting Phosphors for White LEDs
- Cleaved Facet Edge-Emitting Laser Diodes Grown on Semipolar GaN
- Enhancing Growth of Semipolar (Al,In,Ga,B)N Films via MOCVD
- Device Structure for High Efficiency LED
- Nitride-Based LED with Optimized Efficiency
- High-Efficiency, White, Single, or Multi-Color LED by Photon Recycling
- GaN-Based Thermoelectric Device for Micro-Power Generation
- Mirrorless LED with High Luminous Efficiency
- Hybrid Inorganic Light-Emitting Devices
- Growth of High-Quality, Thick, Non-Polar M-Plane GaN Films
- Method for Growing High-Quality Group III-Nitride Crystals
- Growth of Planar Semi-Polar Gallium Nitride
- Defect Reduction of Non-Polar and Semi-Polar III-Nitrides
- MOCVD Growth of Planar Non-Polar M-Plane Gallium Nitride
- Lateral Growth Method for Defect Reduction of Semipolar Nitride Films
- Low Temperature Deposition of Magnesium Doped Nitride Films
- Growth of Polyhedron-Shaped Gallium Nitride Bulk Crystals
- Long Wavelength Nonpolar and Semipolar Nitride-Based Laser Diodes
- Semipolar III-Nitride Laser Diodes with Etched Mirrors
- Method for Making a High Performance Vertical Cavity Surface Emitting Laser
- Faster Growth of Large III Nitride Crystals
- Higher Purity Environment for the Ammonothermal Growth of Group III Nitrides
- LED Structure with Low Efficiency Droop for High-Current Applications
- Improved Manufacturing of Solid State Lasers via Patterning of Photonic Crystals
- Low Carrier Loss Device Structure for High Performance Green LEDs
- Control of Photoelectrochemical (PEC) Etching by Modification of the Local Electrochemical Potential of the Semiconductor Structure
- Phosphor-Free White Light Source
- Method for Wafer Bonding for Optoelectronic Applications
- Single or Multi-Color High Efficiency LED by Growth Over a Patterned Substrate
- High Efficiency LED with Optimized Photonic Crystal Extractor
- Wafer Bonding For Highly Efficient Nitride-Based LEDs
- Packaging Technique for the Fabrication of Polarized Light Emitting Diodes
- LED Device Structures with Minimized Light Re-Absorption
- High Efficiency and High Brightness LEDs for Various Lighting Applications
- Photoelectrochemical Etching for Laser Facets
- Enhancement Of Thermoelectric Properties Through Polarization Engineering
- Two dimensionally relaxed III-N buffer layers for LEDs
- Novel Layer Structure for Semipolar InGaN/GaN LEDs and Laser Diodes
- Efficient High-Power, Laser-Driven White Lighting Device
- GaN-based Green/Red Light-Emitting Diodes With Low Voltage
- Outdoor Street Light Fixture with Novel Laser Diode Light Source
- Improved LED Performance via Optimized Polarization Properties
- (In,Ga,Al)N Optoelectronic Devices with Thicker Active Layers for Improved Performance
- Controlling Contact Resistivity of Transparent Conductive Layers of Optoelectronic Devices
- Natural Convection for Ammonothermal Growth of Group-III Nitrides
- Inhibiting Decomposition of Nitrogen-Containing Solvents during Ammonothermal Growth
- Using Off Oriented Seeds to Grow Non-Polar or Semi-Polar Group-III Nitride Crystals
PEOPLE WHO VIEWED THIS ALSO VIEWED THESE TECHNOLOGIES BY OTHER INVENTORS
- Photonic Structures for Efficient Light Extraction and Conversion in Multi-Color LEDs
- Donor-Acceptor Rod-Coil Diblock Copolymer based on P3HT containing fullerene (C¬60)
- Method of Preparing Silicon and Silicon-Germanium Nanocomposites as Thermoelectric Materials
- Method for Producing GaN Substrates for Electronic and Optoelectronic Devices
- Selective Dry Etching of N-Face (Al, In, Ga)N Heterostructures


